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Table Top Shadow Moiré  Warpage Metrology tool

Table Top Warpage Metrology Technology from Akrometrix

To complement their range of Thermal Warpage Metrology Solutions, Akrometrix have launched their latest addition. The TTSM, Table Top Shadow Moiré  Warpage Metrology tool is an ideal solution to room temperature surface warpage measurement. Suited to inline use as well, the TTSM uses Shadow Moiré technology to provide fast results when measuring substrates to 330 mm square, and offers full field of view measurement of 1.2 million data points in under two seconds.

It will accommodate a 300 mm pcb, panel, wafer, or 2 JEDEC trays per measurement and will achieve a z- resolution to 1.25 µm. It is also suitable for applications in engineering parts manufacture.

Using the same STUDIO Software Suite that is found in the other Akrometrix solutions, Part Tracking will use edge detection to select multiple devices in a single scan, and report them individually.

At 32 kg, the TTSM is an ideal addition to laboratory or manufacturing facilities that need fast, reliable and accurate automated measurement of warpage and coplanarity.

Accelonix will be showing this exciting technology at the Advanced Engineering Show, stand O82, at the NEC on 1st and 2nd of November.