Cyber TECHNOLOGIES CT100

Post-Doctoral Symposium, Imperial College

On Friday 17 June Accelonix Ltd.'s Metrology Division joined the Post-Doctoral Symposium held by the Department Of Materials, Imperial College in London.

The symposium was attended by a number of research members and members of staff with a series of presentations delivered by researchers on the work they were engaged in. There was a supporting exhibition attended by 5 companies, who were sponsors of awards based on best oral presentation, best poster presentation and best photograph of a materials based image.

Business Manager Keith Dear was invited to act as an independent judge for the awards.

Accelonix Ltd presented the Cyber Technologies CT100 3D non-contact surface measurement system, running an automated scan of a complex machined surface. The demonstration showed the speed and versatility of measurement and included surface roughness, hole dimensions, surface form assessment, including measurement of engraving depth on a complex curved surface.

Accelonix and Cyber Technologies will be joining forces next week at the 2nd "UK Industrial Surface Engineering – Present and Future" Conference, taking place at Cranfield University where the CT100 system will be on display again.

So far this year Accelonix Ltd.’s Metrology Division has participated in

"MicroTech 2016 Conference on Sensors, MEMS and Advanced Packaging", held at the Heriot-Watt University Conference centre on 17 March, and the

"Engineering Testing Show" which was held at the Derby Roundhouse Centre on 6 April.