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COVID-19 response: Accelonix continues to operate as close to normal as possible while adhering to the government regulations. All orders are processed and we currently experience no disruptions to our supply chains.
Our PCBA testing facility is open for board testing and we offer remote support of all equipment under contract. Essential site visits can be carried out in keeping with the guidelines.
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cyberTECHNOLOGIES CT 300 Non-Contact Profilometer For Large Areas

cyberTECHNOLOGIES CT 300 Non-Contact Profilometer for Large Areas
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3D Scan of Wafer
full large area scan
Flatness Scan Screen Shot
The CT 300 is a non-contact profilometer with a 315 mm x-, y-motion system. It can handle up 12" wafers or other large substrates and parts.

Using a chromatic white light sensor and a data collection rate of up to 20 kHz the inspection time is minimized. The confocal microscope and 3D white light interferometer sensors offer unmatched resolution in z-direction down to 0.1nm. With our multi-sensor technology several sensor heads can be mounted simultaneously including infrared interferometers for measuring wafer thickness.
  • 315 mm travel in x- and y-direction, lateral resolution 0.05 microns, optional motorized z-axis
  • Large scanning areas, up to the maximum travel of 315 mm with maximum x-, y-, z-resolution
  • Chromatic white light sensors
  • 3D white light interferometer
  • Confocal microscope
  • High-speed confocal line sensor
  • Interferometer for thickness measurement
  • Measurement speed 2kHz / 4kHz / 20 kHz
  • Fast and accurate magnetic linear motors
  • High resolution off-axis camera
  • 2D profiles and 3D topographical maps (topography measurement)

For further information please visit www.cybertechnologies.com