cyberTECHNOLOGIES CT 100 Non-Contact Profilometer

cyberTECHNOLOGIES CT100 non contact profilometer
cyberTECHNOLOGIES CT100 non contact profilometer
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The CT 100 is a compact, high resolution non-contact profilometer. The main components of the system are a white light sensor and an x-, y-motion system on a granite platform. The chromatic white light sensors combine high accuracy and high measurement speed. The sensors are available with a resolution down to 3 nm and measurement range up to 12 mm. The system can scan a maximum area of 150 mm x 150 mm. The unique cyberTECHNOLOGIES Software offers sophisticated surface metrology analysis and automated measurement routines.
  • Large scanning areas, up to the maximum travel of 150 mm with maximum x-, y-, z-resolution
  • 150 mm travel in x- and y-direction, lateral resolution 0.05 microns
  • Chromatic white light sensors
  • 3D white light interferometer
  • Interferometer for thickness measurement
  • Measurement speed: 2 kHz / 4 kHz / 20 kHz
  • High resolution camera
  • Fast and accurate magnetic linear motors
  • 2D profiles and 3D topographical maps (topography measurement)



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