cyberTECHNOLOGIES Non‑Contact Surface Measurement

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cyberTECHNOLOGIES is the leading supplier of high‑resolution, non‑contact 3D measurement systems for industrial and scientific applications. The heart of the system is a range of high resolution optical sensors; confocal white light or laser‑based in point, line or microscope format.

Used worldwide, the advanced software solutions provide the user with a full range of options, from research to full automation. Microelectronics and surface engineering applications include thickfilm measurement, solar cell measurement, flatness, coplanarity, roughness, stress, TTV measurement and much more. The technology can work with solid, powder or liquid surfaces; opaque, translucent, transparent, as well as black or highly reflective surfaces.

Vantage Non‑contact surface measurement platform

The cyberTECHNOLOGIES Vantage products are non‑contact surface measurement systems suited to production and cleanroom environments. The Vantage 50 provides a 2D profile capability using triangulation sensors for thick film work, and laser for solar panel assessment. The Vantage 2 offers a motorised 3D x and y axis covering a 200 mm square, with a manual height adjustment to 50 mm. It is ideal for a cleanroom environment. Both systems utilise the full ScanCT software for setting up, scanning, data acquisition, analysis and reporting.

CT 2D and 3D non‑contact surface measurement platform

The cyberTECHNOLOGIES CT products are designed with flexibility in mind. With a variety of granite platforms to 1.8 m square, sensor options include white light confocal, laser, confocal microscope and interferometry options for different materials. Working heights and measurement ranges can be selected for any application. Several platform types will support multiple sensors. Scanning round objects, or simultaneously scanning both sides of a sample are options.

The rapid scanning process and full library of measurement parameters give a high degree of flexibility and automation to a wide range of surface engineering and microelectronic applications where size of sample, or the number to be scanned are important. Full automation of the process is available for production environments.

Inline

The cyberTECHNOLOGIES scanning platform is also available as an integrated solution to provide automated non‑contact scanning of any surface directly in the production process.

Optical sensor options for non‑contact surface measurement

The flexibility of the cyberTECHNOLOGIES systems relates to the range of optical sensors which the platforms and software can accommodate.  A suitable sensor selection gives the user control over the measurement range and resolution required for the material and application; the working heights offer solutions where proximity of the sensor to the inspected surface is controlled by topography, type of light source improves results from difficult surfaces, and interferometry will measure flatness in ultra‑smooth surfaces.

Software for Surface Engineering and Metrology

At the heart of the cyberTECHNOLOGIES product range is the comprehensive suite of functions provided to the operator by the Scan Suite software solution.

Easy to work with, the software provides a complete solution for laboratory or production needs, and covers  setting up, scanning, data acquisition, analysis and reporting. For repeat measurements and production needs, AScan will automate the processes involved, including full image analysis, and statistical process control reporting.

The 3D graphics provide high resolution images of the captured data for report or presentation work.